How To SSD test technical lecture content

How To SSD test technical lecture content

In the near future, we plan to invite well-known foreign SSD test experts from the United States, the United Kingdom, the Netherlands, Italy, India, and South Korea to share how to test PCIe Gen 3/4 NVMe SSDs over the weekend. I hope you will actively vote on the topics you want to participate in. We will vote according to the voting results. Decide the order of the topics, SSD test and for topics not covered below, you can also let us know by private message to see if we can arrange for experts to communicate in the future.

Topic 1: PCIe Gen 4 NVMe SSD Protocol Analysis and Problem Diagnosis

Overview: If you are or have ever been deeply touched by the following problems encountered in PCIe/NVMe protocol analysis, then participating in this technical sharing will greatly improve the efficiency of your testing and problem analysis:

1) Saving a large trace file, such as a 128G byte file, takes several hours or even breaks or is impossible;

2) Repeatedly hot-plugging the NVMe SSD to reproduce a problem, but after the fault recurs, it is found that the trace decoding error captured by the analysis tool is wrong;

3) After accessing the interposer of the protocol analysis tool, it is found that the problems that need to be analyzed and solved before disappear inexplicably or new problems appear.

Topic 2: NVMe SSD Test (1)

Overview: This part focuses on how to perform performance test (read/write pressure, fault injection, other NVMe command injection), function test, abnormal power failure test, power consumption test, fault analysis (protocol analysis, Log analysis) for NVMe SSD, UNH IOL protocol compatibility test, how to integrate third-party hot swap and voltage biasing tools for automated testing, etc.

Topic 3: NVMe SSD Test (2)

Overview: This part focuses on how to automate testing of NVMe SSDs, including automated framework design, Python script syntax, test report analysis and output, and how well-known companies such as Google and Facebook test and introduce third-party SSDs, etc. .

Topic 4: NVMe SSD hot-plug automated test and voltage bias test

Overview: This part focuses on how major international manufacturers use automated test tools to simulate/simulate various Corner Cases in the hot-swap automated test process to expose various problems that SSDs may encounter during the hot-swap process. In addition, it will also describe how to perform voltage bias test for SSD, and achieve accurate voltage/current/power consumption measurement and real-time/backtracking analysis.

Topic 5: NAND characteristic analysis and testing

Overview: This part focuses on the characteristic analysis and testing of the most important NAND Flash for SSD, especially the bit error rate (BER) distribution curve of reading NAND under different temperature conditions, which is especially useful for engineers engaged in ECC/LDPC algorithm optimization. Helpful, but also briefly describes the rapid screening test tools involved in mass production NAND.SSD test

Topic 6: Simulation Test of NVMe SSD Real Application Scenario

Overview: After NVMe SSD solves the problems of physical layer, protocol layer and application layer and is verified by professional performance/function test tools, it actually faces various user experience problems in real application scenarios. This part focuses on how to use VDI Professional simulation software realizes the test of user experience deployed on SSD. Users can intuitively see the experience score (10 points is a full score). These tools are necessary for VMWare View and Ctrix VDI manufacturers to test, and they are also used by enterprise users for deployment. Required test items before these programs.

Topic 7: UFS 3.0 Protocol Analysis and Troubleshooting

Overview: In the consumer market, in addition to M.2 NVMe SSDs, there are actually many scenarios where UFS devices are used. The most typical ones are mid-to-high-end mobile phones and some ultrabook laptops (such as HP). The bottom layer of UFS uses MPHY. Very similar to PCIe differential signaling, the current MPHY Gear 4 used by UFS 3.0 supports 11.6Gbps (more than PCIe Gen 3), the next generation Gear 5 should support 23.2Gbps (will exceed PCIe Gen 4), but the upper layer of UFS 3.0 uses SCSI protocol, efficiency No NVMe instruction high. This part mainly describes UFS 3.0 problem diagnosis and protocol analysis.

Topic 8: NVMe SSD and UFS 3.0 batch testing professional equipment function introduction

This part focuses on how to implement various automated tests for NVMe SSD and UFS 3.0 devices at normal temperature and professional high and low temperature conditions.

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